Optical characterization of multilayer stacks for phase-change media

Rongguang Liang; Chubing Peng; Kenichi Nagata; Kelly Daly Flynn; Masud Mansuripur

doi:10.1117/12.453427

10 January 2002 Optical characterization of multilayer stacks for phase-change media

Rongguang Liang, Chubing Peng, Kenichi Nagata, Kelly Daly Flynn, Masud Mansuripur

Proceedings Volume 4342, Optical Data Storage 2001; (2002) https://doi.org/10.1117/12.453427
Event: Optical Data Storage, 2001, Santa Fe, NM, United States

Abstract

We report results of measurements of the optical constants of the dielectric layer, reflecting layer, and phase-change layer used as the media of phase-change optical recording. The refractive index and the absorption coefficient k of these materials vary to some extent with the film thickness and with the film deposition environment. We report the observed variations of optical constants among samples of differing structure and among samples fabricated in different laboratories.

Citation Download Citation

Rongguang Liang, Chubing Peng, Kenichi Nagata, Kelly Daly Flynn, and Masud Mansuripur "Optical characterization of multilayer stacks for phase-change media", Proc. SPIE 4342, Optical Data Storage 2001, (10 January 2002); https://doi.org/10.1117/12.453427

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