Application of Ritchey-Common test in large flat measurements

Sen Han; Erik Novak; Mike Schurig

doi:10.1117/12.445584

3 October 2001 Application of Ritchey-Common test in large flat measurements

Sen Han, Erik Novak, Mike Schurig

Proceedings Volume 4399, Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering; (2001) https://doi.org/10.1117/12.445584
Event: Lasers in Metrology and Art Conservation, 2001, Munich, Germany

Abstract

The Ritchey-Common test is a well-known method for large flat measurements. This paper describes a straightforward implementation ofthe formulas, to allow accurate surface height calculation using relatively few separate measurements. Both Ritchey-Common test and direct measurement results are presented. In comparison of the two methods, the RitcheyCommon test is in good agreement with the direct measurement.

Citation Download Citation

Sen Han, Erik Novak, and Mike Schurig "Application of Ritchey-Common test in large flat measurements", Proc. SPIE 4399, Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering, (3 October 2001); https://doi.org/10.1117/12.445584

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