Interferometric measurements of back focal length and insertion loss of precision microlens arrays

Phillip H. Malyak; David L. Kent; Paul R. Kolodner; John Crawford

doi:10.1117/12.448154

13 November 2001 Interferometric measurements of back focal length and insertion loss of precision microlens arrays

Phillip H. Malyak, David L. Kent, Paul R. Kolodner, John Crawford

Author Affiliations +

Proceedings Volume 4437, Gradient Index, Miniature, and Diffractive Optical Systems II; (2001) https://doi.org/10.1117/12.448154
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

Microlenses are being applied widely, especially in fiber- optic components and modules. The lenses are frequently made in arrays which are coupled with fiber arrays to make arrays of collimated laser beams. A back focal length (BFL) that is uniform across the array and a low average insertion loss are critical for many applications. In this paper, we describe interferometric techniques for measuring the BFL and IL of all elements in a microlens array, and we document the measurement precision. The BFL of a lens can be measured interferometrically by illuminating it with a point source that is generated by a converging lens in the test leg of the interferometer. The point source is initially located at the back focal point of the lens under test (i.e., confocal configuration) and a plane mirror reflects the beam back through the lens and into the interferometer. The interferometer is then moved axially to obtain the cat's eye reflection from the back surface of the lens. The BFL is equal to the axial distance between these two points. We report results of measurements of BFL and IL of microlenses having nominal BFL of 3.4 mm. The BFL is measured to a precision of <4micrometers . The precision depends primarily on the test wavelength and the n.a. of the test. part, and these relationships are described. The IL is a function of transmitted wavefront error, and we compare wavefront- derived IL to the directly-measured IL.

Citation Download Citation

Phillip H. Malyak, David L. Kent, Paul R. Kolodner, and John Crawford "Interferometric measurements of back focal length and insertion loss of precision microlens arrays", Proc. SPIE 4437, Gradient Index, Miniature, and Diffractive Optical Systems II, (13 November 2001); https://doi.org/10.1117/12.448154

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE