Measurement of both sample width and differential refractive index through spectrally resolved white light interferometry

Carmen Sainz; Jose E. Calatroni; Rafael A. Escalona Z.

doi:10.1117/12.449374

26 November 2001 Measurement of both sample width and differential refractive index through spectrally resolved white light interferometry

Carmen Sainz, Jose E. Calatroni, Rafael A. Escalona Z.

Author Affiliations +

Proceedings Volume 4448, Optical Diagnostics for Fluids, Solids, and Combustion; (2001) https://doi.org/10.1117/12.449374
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

Spectrally Resolved White Light Interferometry (SRWLI) is used for precise measurements of both the sample width and the differential refractive index, attaining precision of about 10^-6 in the refractive index. This is achieved through the experimental simulation of a thin virtual cell about 40μm wide.

Citation Download Citation

Carmen Sainz, Jose E. Calatroni, and Rafael A. Escalona Z. "Measurement of both sample width and differential refractive index through spectrally resolved white light interferometry", Proc. SPIE 4448, Optical Diagnostics for Fluids, Solids, and Combustion, (26 November 2001); https://doi.org/10.1117/12.449374

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