Absolute EUV yield of laser-irradiated Xe-clusters dependent on pulse width

Peter Viktor Nickles; Matthias Schnuerer; Holger Stiel; Ulrich Vogt; Sarkis A. Ter-Avetisyan; Wolfgang Sandner

doi:10.1117/12.448455

14 November 2001 Absolute EUV yield of laser-irradiated Xe-clusters dependent on pulse width

Peter Viktor Nickles, Matthias Schnuerer, Holger Stiel, Ulrich Vogt, Sarkis A. Ter-Avetisyan, Wolfgang Sandner

Proceedings Volume 4504, Applications of X Rays Generated from Lasers and Other Bright Sources II; (2001) https://doi.org/10.1117/12.448455
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

Large Xe-clusters have been excited with 50 fs and 2 ps pulses from a Ti:Sa multi - TW laser at 800 nm wavelength. Additionally a 10 ns Nd:YAG laser at 1064 nm wavelength was used to heat Xe-cluster/gas and a liquid Xe-spray target. Absolute yield measurements of EUV-emission in a wavelength range between 10 nm and 15 nm in combination with target variations were carried out. The ps-laser pulse has resulted in about 30 percent enhanced and spatially more uniform EUV-emission compared to fs-laser excitation. Similar emission has been obtained with ns-pulse exposure of different target modifications which also act back to the EUV-source size. Absolute emission efficiencies at 13.4 nm of up to 0.8 percent in 2pi sr and 2.2 percent bandwidth were measured.

Citation Download Citation

Peter Viktor Nickles, Matthias Schnuerer, Holger Stiel, Ulrich Vogt, Sarkis A. Ter-Avetisyan, and Wolfgang Sandner "Absolute EUV yield of laser-irradiated Xe-clusters dependent on pulse width", Proc. SPIE 4504, Applications of X Rays Generated from Lasers and Other Bright Sources II, (14 November 2001); https://doi.org/10.1117/12.448455

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