Stress measurement with two-dimensional x-ray diffraction

Bob B. He

doi:10.1117/12.468800

29 May 2002 Stress measurement with two-dimensional X-ray diffraction

Bob B. He

Proceedings Volume 4537, Third International Conference on Experimental Mechanics; (2002) https://doi.org/10.1117/12.468800
Event: Third International Conference on Experimental Mechanics, 2002, Beijing, China

Abstract

2D diffraction systems, when used for residual stress measurement, have many advantages over the conventional 1D diffraction systems in dealing with highly textured materials, large grain size, small sample area, and weak diffraction systems in dealing with highly textured materials, large grain size, small sample area, and weak diffraction. The stress measurement is based on the fundamental relationship between the stress tensor and the diffraction cone distortion. The benefit of the 2D method is that all the data points on diffraction rings are used to calculate stresses so as to get better measurement result with less data collection time. The present paper introduces the recent development in the theory and applications of stress measurement using 2D detectors.

Citation Download Citation

Bob B. He "Stress measurement with two-dimensional X-ray diffraction", Proc. SPIE 4537, Third International Conference on Experimental Mechanics, (29 May 2002); https://doi.org/10.1117/12.468800

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