Interferometric method to characterize thermal elongation of near-field optics probes

Andres H. La Rosa; Bjorn Biehler; Arijit Sinharay; Hans D. Hallen

doi:10.1117/12.472244

20 June 2002 Interferometric method to characterize thermal elongation of near-field optics probes

Andres H. La Rosa, Bjorn Biehler, Arijit Sinharay, Hans D. Hallen

Proceedings Volume 4777, Interferometry XI: Techniques and Analysis; (2002) https://doi.org/10.1117/12.472244
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

This paper presents a new method that exploits the interference and polarization properties of light to monitor, in real time, the rapid thermal elongation of near-field optical probes. The typically flat (nanometer in size) morphology of the probe apex serves as one mirror of a Fabry-Perot type cavity; a flat semitransparent metal coated surface constitutes the other mirror. The optical-interferometry set-up permits distance acquisition with a high frequency bandwidth (compared to other methods based on electronic feedback) while control of the light polarization allows an increase of the signal to noise ratio of the measurements.

Citation Download Citation

Andres H. La Rosa, Bjorn Biehler, Arijit Sinharay, and Hans D. Hallen "Interferometric method to characterize thermal elongation of near-field optics probes", Proc. SPIE 4777, Interferometry XI: Techniques and Analysis, (20 June 2002); https://doi.org/10.1117/12.472244

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