Paper
20 June 2002 Polarization-dependent effects on phase singularities in the vicinity of sub-lambda structures
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Abstract
We present theoretical and experimental studies of the reflected field in the vicinity of sub λ structures. Rigorous numerical calculations and measurements were performed to get high-precision information of certain object parameters which go beyond the limits of classical microscopy. We show that the polarization of the illumination plays a key role for the field distribution, which is reflected from the examined objects. Furthermore, we present a simplified model, which is able to qualitatively predict the behavior of the phase singularities correctly.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Manfred Eberler, Susanne Quabis, Ralf Dorn, and Gerd Leuchs "Polarization-dependent effects on phase singularities in the vicinity of sub-lambda structures", Proc. SPIE 4777, Interferometry XI: Techniques and Analysis, (20 June 2002); https://doi.org/10.1117/12.472236
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Cited by 2 scholarly publications.
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KEYWORDS
Phase measurement

Spiral phase plates

Polarization

Silicon

Microscopes

Objectives

Image processing

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