Radiation damage test of the x-ray CCDs with low-energy protons

Emi Miyata; Hirohiko Kouno; Tomoyuki Kamazuka; Mitsunori Fukuda; Mototsugu Mihara; Kensaku Matsuta; Kanenobu Tanaka; Hiroshi Tsunemi; Tadanori Minamisono; Hiroshi Tomida; Kazushisa Miyaguchi

doi:10.1117/12.451160

10 January 2003 Radiation damage test of the x-ray CCDs with low energy protons

Emi Miyata, Hirohiko Kouno, Tomoyuki Kamazuka, Mitsunori Fukuda, Mototsugu Mihara, Kensaku Matsuta, Kanenobu Tanaka, Hiroshi Tsunemi, Tadanori Minamisono, Hiroshi Tomida, Kazushisa Miyaguchi

Author Affiliations +

Proceedings Volume 4784, X-Ray and Gamma-Ray Detectors and Applications IV; (2003) https://doi.org/10.1117/12.451160
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

We have investigated the radiation damage effects on a CCD to be employed in the Japanese X-ray astronomy mission including the Monitor of All-sky X-ray Image (MAXI) onboard the International Space Station (ISS). The X-ray CCD camera, ACIS, onboard Chandra have been seriously damaged by low energy protons having energy of ~150 keV since low energy protons release their energy mainly at the charge transfer channel, resulting a decrease of the charge transfer efficiency. We thus focused on the low energy protons in our experiments. We measured the degradation of the charge transfer efficiency and the dark current as a function of incremental fluence. We have also developed the different device architectures to minimize the radiation damage in orbit. We thus compared the differences of performance after proton irradiation. We then investigated the spatial distribution of the low energy protons in the orbit of the ISS. We found that their density has a peak around l~20° and b~-55° independent of the attitude. The peak value is roughly two orders of magnitude larger than that at the South Atlantic Anomaly. Taking into account the new anomaly and orbit of the ISS, we estimated the charge transfer inefficiency of MAXI CCDs to be 1.1 × 10^-5 per each transfer after two years of mission life in the worse case analysis if the highest radiation-tolerant device is employed. This value is well within the requirement and we have confirmed the high radiation-tolerance of MAXI CCDs.

Citation Download Citation

Emi Miyata, Hirohiko Kouno, Tomoyuki Kamazuka, Mitsunori Fukuda, Mototsugu Mihara, Kensaku Matsuta, Kanenobu Tanaka, Hiroshi Tsunemi, Tadanori Minamisono, Hiroshi Tomida, and Kazushisa Miyaguchi "Radiation damage test of the x-ray CCDs with low energy protons", Proc. SPIE 4784, X-Ray and Gamma-Ray Detectors and Applications IV, (10 January 2003); https://doi.org/10.1117/12.451160

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
12 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Charge-coupled devices

Semiconducting wafers

X-rays

Oxides

Silicon

CCD cameras

X-ray astronomy

Show All Keywords

Keywords/Phrases

Search In:

Publication Years