New metric for 3D optical pattern recognition system

Abdul Ahad Sami Awwal; Karl Solvi Gudmundsson; M. Tabrez; M. Rahman; Mohammad S. Alam; Khan M. Iftekharuddin

doi:10.1117/12.453729

15 November 2002 New metric for 3D optical pattern recognition system

Abdul Ahad Sami Awwal, Karl Solvi Gudmundsson, M. Tabrez, M. Rahman, Mohammad S. Alam, Khan M. Iftekharuddin

Proceedings Volume 4788, Photonic Devices and Algorithms for Computing IV; (2002) https://doi.org/10.1117/12.453729
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

In this paper, a novel metric is defined that will allow one to compare the performance of 3-D pattern recognition systems. Any real object is inherently, three-dimensional. Therefore, any input object for an automated target recognition system should be ideally compared to the 3-D information about the object. The proposed metric captures the essence of such comparisons.

Citation Download Citation

Abdul Ahad Sami Awwal, Karl Solvi Gudmundsson, M. Tabrez, M. Rahman, Mohammad S. Alam, and Khan M. Iftekharuddin "New metric for 3D optical pattern recognition system", Proc. SPIE 4788, Photonic Devices and Algorithms for Computing IV, (15 November 2002); https://doi.org/10.1117/12.453729

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