Entangled-photon ellipsometry

Alexander V. Sergienko; Ayman F. Abouraddy; Kimani C. Toussaint Jr.; Bahaa E. A. Saleh; Malvin C. Teich

doi:10.1117/12.524615

19 November 2003 Entangled-photon ellipsometry

Alexander V. Sergienko, Ayman F. Abouraddy, Kimani C. Toussaint Jr., Bahaa E. A. Saleh, Malvin C. Teich

Proceedings Volume 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life; (2003) https://doi.org/10.1117/12.524615
Event: 19th Congress of the International Commission for Optics: Optics for the Quality of Life, 2002, Florence, Italy

Abstract

We present a novel quantum interferometric technique to perform ellipsometric measurements. Classical ellipsometric measurements are limited in their accuracy by virtue of the need for an absolutely calibrated source and detector. Mitigating this limitation requires the use of a well-characterized reference sample. Our technique relies on the use of a non-classical optical source, namely polarization-entangled twin photons generated by spontaneous parametric down-conversion from a nonlinear crystal, in conjunction with a coincidence-detection scheme. We have demonstrated that entangled-photon ellipsometry eliminates the necessity of constructing an interferometer altogether and is thereby self-referencing. The underlying physics that leads to this remarkable result is the presence of fourth-order (coincidence) quantum interference of the photon pairs in conjuction with polarization entanglement.

Citation Download Citation

Alexander V. Sergienko, Ayman F. Abouraddy, Kimani C. Toussaint Jr., Bahaa E. A. Saleh, and Malvin C. Teich "Entangled-photon ellipsometry", Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); https://doi.org/10.1117/12.524615

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