11 March 2003 Radiation damage studies of XAA1.2 ASIC chip for the SuperAGILE experiment onboard AGILE
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Abstract
SuperAGILE is the X-ray instrument of the AGILE Mission. It is a set of silicon micro-strip detectors tiles coupled with a tungsten coded mask. The front end electronics of SuperAGILE is based on 48 ASIC XAA1.2 chips, each one collecting and conditioning the signals from 128 strips of the detector. Since this chip was not developed as a radiation resistant component for space applications and in order to predict and prevent the potential problems deriving from the space radiation environment, we irradiated two of such chips with ions of different chemical specie, ranging from 16O to 127I. At the 15 MV Tandem accelerator of the Laboratori Nazionali INFN di Legnaro we measured the occurrence of latch-up and Single Event Upset and the effects due to the absorbed total dose on the supply currents and on the bias currents which control the performances of the chip. In this paper we discuss how the results can be scaled to the AGILE environment and the impact of these data on the experiment design and on the observing strategy.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ettore Del Monte, Ettore Del Monte, Enrico Costa, Enrico Costa, Giuseppe Di Persio, Giuseppe Di Persio, Marco Feroci, Marco Feroci, Marcello Mastropietro, Marcello Mastropietro, E. Morelli, E. Morelli, Luigi Pacciani, Luigi Pacciani, G. Porrovecchio, G. Porrovecchio, Massimo Rapisarda, Massimo Rapisarda, Alda Rubini, Alda Rubini, Paolo Soffitta, Paolo Soffitta, D. Bisello, D. Bisello, Andrea Candelori, Andrea Candelori, Alexander Kaminski, Alexander Kaminski, Jeff Wyss, Jeff Wyss, } "Radiation damage studies of XAA1.2 ASIC chip for the SuperAGILE experiment onboard AGILE", Proc. SPIE 4851, X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy, (11 March 2003); doi: 10.1117/12.479579; https://doi.org/10.1117/12.479579
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