New test stand for dynamically testing coupon samples

Yan Zhang; Thomas D. Milster; John Butz; Warren L. Bletscher

doi:10.1117/12.533129

16 September 2003 New test stand for dynamically testing coupon samples

Yan Zhang, Thomas D. Milster, John Butz, Warren L. Bletscher

Proceedings Volume 5069, Optical Data Storage 2003; (2003) https://doi.org/10.1117/12.533129
Event: Optical Data Storage 2003, 2003, Vancouver, Canada

Abstract

A new dynamic test stand is built to test coupon samples for volumetric bit wise optical data storage applications. An unconventional rotating head and fixed sample design is employed. Results from media samples are reported that illustrate pulse-length/power optimization and focus sensitivity. One sample is shown to be appropriate for volumetric applications based in its focus sensitivity.

Citation Download Citation

Yan Zhang, Thomas D. Milster, John Butz, and Warren L. Bletscher "New test stand for dynamically testing coupon samples", Proc. SPIE 5069, Optical Data Storage 2003, (16 September 2003); https://doi.org/10.1117/12.533129

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