Estimating the depth of field of a complex sensor system

John M. Hall

doi:10.1117/12.493060

10 October 2003 Estimating the depth of field of a complex sensor system

John M. Hall

Proceedings Volume 5074, Infrared Technology and Applications XXIX; (2003) https://doi.org/10.1117/12.493060
Event: AeroSense 2003, 2003, Orlando, Florida, United States

Abstract

A complex sensor system may include imaging optics, detector assemblies, image processing, and display components. The depth of field for such systems is not always best characterized by the optical diffraction or geometric limits, therefore a more comprehensive approach may be necessary. A superset of the Rayleigh optical focus criteria, which includes the effects of all major system components, can be applied to the entire system transfer function in order to conduct a comprehensive depth of field analysis. Examples of this method will be shown for a variety of sensor configurations.

Citation Download Citation

John M. Hall "Estimating the depth of field of a complex sensor system", Proc. SPIE 5074, Infrared Technology and Applications XXIX, (10 October 2003); https://doi.org/10.1117/12.493060

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