Array nonuniformity correction: new procedures designed for difficult measurement conditions

Breck A. Sieglinger; James D. Norman; William M. Meshell; David S. Flynn; Rhoe A. Thompson; George C. Goldsmith II

doi:10.1117/12.488620

12 September 2003 Array nonuniformity correction: new procedures designed for difficult measurement conditions

Breck A. Sieglinger, James D. Norman, William M. Meshell, David S. Flynn, Rhoe A. Thompson, George C. Goldsmith II

Proceedings Volume 5092, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII; (2003) https://doi.org/10.1117/12.488620
Event: AeroSense 2003, 2003, Orlando, Florida, United States

Abstract

For many types of infrared scene projectors, differences in the outputs of individual elements are one source of error in projecting a desired radiance scene. This is particularly true of resistor-array based infrared projectors. Depending on the sensor and application, the desired response uniformity may prove difficult to achieve. The properties of the sensor used to measure the projector outputs critically affect the procedures that can be used for nonuniformity correction (NUC) of the projector, as well as the final accuracy achievable by the NUC. In this paper we present a description of recent efforts to perform NUC of an infrared projector under “adverse” circumstances. For example, the NUC sensor may have some undesirable properties, including: significant random noise, large residual response nonuniformity, temporal drift in bias or gain response, vibration, and bad pixels. We present a procedure for reliably determining the output versus input response of each individual emitter of a resistor array projector. This NUC procedure has been demonstrated in several projection systems at the Kinetic Kill Vehicle Hardware-In-the-Loop Simulator (KHILS) including those within the KHILS cryogenic chamber. The NUC procedure has proven to be generally robust to various sensor artifacts.

Citation Download Citation

Breck A. Sieglinger, James D. Norman, William M. Meshell, David S. Flynn, Rhoe A. Thompson, and George C. Goldsmith II "Array nonuniformity correction: new procedures designed for difficult measurement conditions", Proc. SPIE 5092, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII, (12 September 2003); https://doi.org/10.1117/12.488620

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