X-ray calibration of the GOES-N/O solar X-ray imagers

Paul R. Catura; Brennan L. Gantner; Bruce K. Jurcevich; Claude K. Kam; James R. Lemen; Mons D. Morrison; Lawrence Shing; Richard C. Catura

doi:10.1117/12.507639

4 February 2004 X-ray calibration of the GOES-N/O solar X-ray imagers

Paul R. Catura, Brennan L. Gantner, Bruce K. Jurcevich, Claude K. Kam, James R. Lemen, Mons D. Morrison, Lawrence Shing, Richard C. Catura

Author Affiliations +

Proceedings Volume 5171, Telescopes and Instrumentation for Solar Astrophysics; (2004) https://doi.org/10.1117/12.507639
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

The X-ray calibration of the GOES Solar X-ray Imagers (SXI) was accomplished at the component level and at the instrument level. The CCD and thin film filters were characterized in the facilities at the Lockheed Martin Solar and Astrophysics Laboratory. The grazing incidence telescope mirrors and the completed instruments were calibrated at the X-ray Calibration Facility (XRCF) at NASA’s Marshall Space Flight Center. The XRCF consists of an X-ray source at one end of a 518 m long evacuated tube and a large vacuum chamber at the opposite end. The X-ray source has a variety of interchangeable anodes and filters to provide filtered characteristic K- and L-shell line emission in the range from 0.109 to 8.6 keV. The absolute Photometric calibration of the SXI telescopes is very important for analysis and interpretation of their data, and to monitor the long-term solar variations at X-ray wavelengths. This paper describes the results of these calibrations.

Citation Download Citation

Paul R. Catura, Brennan L. Gantner, Bruce K. Jurcevich, Claude K. Kam, James R. Lemen, Mons D. Morrison, Lawrence Shing, and Richard C. Catura "X-ray calibration of the GOES-N/O solar X-ray imagers", Proc. SPIE 5171, Telescopes and Instrumentation for Solar Astrophysics, (4 February 2004); https://doi.org/10.1117/12.507639

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available