Characterization of the new FX1 x-ray streak camera

Vincent Pitre; Sebastien Magnan; Jean-Claude Kieffer; Fabien Dorchies; Francois Salin; Catherine Goulmy; Jean-Claude Rebuffie

doi:10.1117/12.503581

28 January 2004 Characterization of the new FX1 x-ray streak camera

Vincent Pitre, Sebastien Magnan, Jean-Claude Kieffer, Fabien Dorchies, Francois Salin, Catherine Goulmy, Jean-Claude Rebuffie

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Proceedings Volume 5194, Fourth-Generation X-Ray Sources and Ultrafast X-Ray Detectors; (2004) https://doi.org/10.1117/12.503581
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

We present the characterization of an ultrafast x-ray streak camera based on a new bilamellar x-ray tube. This camera, named FX1, has been tested in static (imaging) and dynamic (sweep) mode with several continuous and pulsed sub-picosecond UV and X-ray sources. The FX1 camera was designed to overcome some limitations observed with the PX1 camera which has been used previously at INRS to achieve high resolution sub-picosecond time resolved spectroscopy of ultrafast laser produced plasmas. Line Spread Function measurements indicated a strong improvement of the static image contribution to the temporal resolution compared to the PX1 camera performances [Rev. Sci. Instr. 71, 3627, 2000]. Furthermore a much higher dc extraction field can now be sustained at the photocathode-acceleration slit region. The FX1 camera has been successfully operated in various experimental conditions. An upper limit of the temporal response of the FX1 has been measured in the keV x-ray range in single shot mode with a laser-based x-ray source (2keV) having a duration (FWHM) of 1.4 ps. The FX1 camera has also been coupled to photoconductive switches and testesd in accumulation mode [Rev. Sci. Instr. 73, 1617, 2002] with VUV light produced with the 1 kHz Ti:sapphire laser of the CELIA. A newly assembled test-bench is now currently used at INRS for the characterisation of streak cameras in both single-shot and accumulation mode with the 10Hz Ti:sapphire laser of INRS.

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Vincent Pitre, Sebastien Magnan, Jean-Claude Kieffer, Fabien Dorchies, Francois Salin, Catherine Goulmy, and Jean-Claude Rebuffie "Characterization of the new FX1 x-ray streak camera", Proc. SPIE 5194, Fourth-Generation X-Ray Sources and Ultrafast X-Ray Detectors, (28 January 2004); https://doi.org/10.1117/12.503581

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KEYWORDS

Cameras

Streak cameras

Temporal resolution

X-rays

Ultraviolet radiation

Picosecond phenomena

Switches

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