Paper
29 December 2003 Fabrication of passively aligned micro-optics using focused ion beam
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Abstract
Integration of micro-optical elements presents numerous challenges to the optical engineer in both fabrication and integration schemes. Therefore, prototyping integrated micro-optics is somewhat prohibitive due to cost and complexity. In this paper, we present a novel technique based on a subtractive milling process for Focused Ion Beam (FIB) milling of micro-optics into semiconductor devices. Results are presented for an integrated micro-lens in a silicon v-groove turning mirror for a passively aligned optical element.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Waleed S. Mohammed and Eric G. Johnson "Fabrication of passively aligned micro-optics using focused ion beam", Proc. SPIE 5347, Micromachining Technology for Micro-Optics and Nano-Optics II, (29 December 2003); https://doi.org/10.1117/12.522067
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KEYWORDS
Mirrors

Ion beams

Ions

Optical components

Spherical lenses

Imaging systems

Micro optics

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