Paper
28 May 2004 Optimization and apodization of aerial images at high NA in imaging interferometic lithography
Author Affiliations +
Abstract
Imaging Interferometric Lithography (IIL) offers several optimization parameters such as pupil filtering, parsing of frequency coverage, polarization control, and multiple exposure dosage ratios. We discuss the optimal frequency coverages for IIL at NA = .9 and the effects of the dark field (quadratic image autocorrelation terms) on the aerial image under pupil filtering. Next, comparisons are made of exposure latitudes for various dosage ratios and exposures for several weighted errors under different conditions. Lastly, apodization of the pupil filters is considered and shown to alleviate artifacts associated with Gibbs phenomena at hard frequency stops and improve overall image fidelity.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Thanis M. Tridhavee, Balu Santhanam, and Steven R. J. Brueck "Optimization and apodization of aerial images at high NA in imaging interferometic lithography", Proc. SPIE 5377, Optical Microlithography XVII, (28 May 2004); https://doi.org/10.1117/12.533149
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Cited by 4 scholarly publications.
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KEYWORDS
Image filtering

Apodization

Filtering (signal processing)

Lithography

Photoresist materials

Polarization control

Image quality

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