Paper
1 September 2004 Analysis of grating profiles of phase holograms recorded in silver halide emulsions and processed with combinations of various developers and bleaching agents
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Abstract
A large number of plane-wave holograms were recorded in Agfa-Gevaert 8E75HD holographic plates, at a wide range of bias exposures and fringe visibilities. The plates were processed by various combinations of developers (AAC, Pyrogallol and Catechol) and bleaching agents (R-9 and EDTA). The phase gratings were studied by phase-contrast microscopy, using a high-power immersion (100 X) objective. The phase contrast photomicrographs were Fourier-analyzed. Thus first- second- and third-order modulation of the refractive index as a function of the bias exposure and the visibility of the recording interference pattern could be determined. The ratio of the amplitudes of the higher-order modulations to that of the first-order one can serve as a measure of the nonlinearity of the holographic recording.
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Istvan Banyasz "Analysis of grating profiles of phase holograms recorded in silver halide emulsions and processed with combinations of various developers and bleaching agents", Proc. SPIE 5456, Photon Management, (1 September 2004); https://doi.org/10.1117/12.545155
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KEYWORDS
Modulation

Refractive index

Visibility

Holograms

Phase shift keying

Phase contrast

Holography

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