Paper
24 September 2004 Probes for a scanning near-field optical microscope on the base of tapered single-mode optical fiber
V. F. Dryakhlushin, Alexander Yurievich Klimov, Vladimir Rogov
Author Affiliations +
Proceedings Volume 5582, Advanced Optoelectronics and Lasers; (2004) https://doi.org/10.1117/12.583463
Event: 2003 Chapter books, 2003, Bellingham, WA, United States
Abstract
Probes for a scanning near-field optical microscope on the base of a single-mode adiabatically tapered optical fiber have been fabricated by the chemical etching only. The transmission coefficient of light in this probes is 2 - 3 orders magnitude higher than that of mechanically pulled fiber probes. The probe may be used for green (λ = 0.48 - 0.55 μm), red (0.60 - 0.68 μm) and near infrared (0.78 = 1.05 μm) wavelength ranges. The reason of this effect is explained. Probe of the scanning near-field optical microscope on the base of microstrip line is proposed. Review of optical near-field microscopy, surface structure diagnostics and surface modification with nanometer resolution are observed.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
V. F. Dryakhlushin, Alexander Yurievich Klimov, and Vladimir Rogov "Probes for a scanning near-field optical microscope on the base of tapered single-mode optical fiber", Proc. SPIE 5582, Advanced Optoelectronics and Lasers, (24 September 2004); https://doi.org/10.1117/12.583463
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Cited by 3 scholarly publications.
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KEYWORDS
Near field scanning optical microscopy

Near field optics

Metals

Optical microscopes

Microscopes

Near field

Optical fibers

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