Paper
6 May 1985 Multilayers for x-ray optics
Troy W. Barbee Jr.
Author Affiliations +
Abstract
Soon after the discovery of x-rays and their property of constructive interference scattering (diffraction) by solids resulting from the ordered array of atoms forming the solids, it was proposed that man-made (synthetic) layered structures might extend the range of utility of this phenomena into spectral domains not accessible using naturally occurring crystalline materials. The synthesis of such layered materials has been of research interest since the 1920's and in the past decade processes for the formation of multilayer structures of quality sufficient for x-ray optic applications have been developed. In this talk, a short review of the history of this work is given first. The development of effec-tive synthesis processes is then considered and current approaches summarized. The current status of the field of multilayer x-ray optics is then discussed with emphasis on figured structures. Current limitations and the potential for both technological and scientific advances are then considered.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Troy W. Barbee Jr. "Multilayers for x-ray optics", Proc. SPIE 0563, Applications of Thin Film Multilayered Structures to Figured X-Ray Optics, (6 May 1985); https://doi.org/10.1117/12.949647
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Cited by 45 scholarly publications and 1 patent.
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KEYWORDS
Multilayers

Reflectivity

X-ray optics

Scattering

X-rays

Interfaces

Light scattering

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