Paper
21 February 2005 Highly sensitive method for measuring the onset of damage using a micro channel plate
Jens Schwarz, Laurence E. Ruggles, Patrick K. Rambo, John L. Porter
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Abstract
Using a micro channel plate (MCP), we have developed a sensitive method for measuring the onset of laser damage by detecting liberated surface ions and XUV radiation from the laser induced surface plasma. This method is insensitive to optical alignment and therefore assures good repeatability over numerous measurements.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jens Schwarz, Laurence E. Ruggles, Patrick K. Rambo, and John L. Porter "Highly sensitive method for measuring the onset of damage using a micro channel plate", Proc. SPIE 5647, Laser-Induced Damage in Optical Materials: 2004, (21 February 2005); https://doi.org/10.1117/12.585377
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Cited by 1 scholarly publication.
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KEYWORDS
Microchannel plates

Silica

Ions

Laser damage threshold

Diagnostics

Image processing

Laser induced damage

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