Paper
10 June 2005 A near field optical microscopy study of trinitrotoluene
Lewis Mortimer Gomez, Edmy Ferrer, Tatiana Luna, Samuel P. Hernandez, Miguel E. Castro
Author Affiliations +
Abstract
Atomic force microscopy (AFM) and near field scanning optical microscopy (NSOM) are promising analytical techniques for the determination of trace amounts of explosive materials on a variety of surfaces. Information regarding the forces of interaction and explosive spectroscopic signatures, in addition to explosive morphology, can be obtained with AFM and NSOM techniques. Basic work toward the development of methodology that can enable the employment of these techniques is needed to facilitate their employment in the field and real life scenarios. In this work, we report on the use of AFM and NSOM for the determination of the morphology and spectroscopic signature of TNT particles on optically transparent substrates open to air environments. The TNT particles are about 1 mm in diameter. Transmission NSOM on the particles following 265 nm excitation reveals that the fluorescence peak is centered at 255, about 10 cm-1 lower than the excitation wavelength. The fluorescence yield is found to increase non-linearly with incident laser power, consistent with a multi photon absorption process. The results encourage future work in the area, in particular, with the use of multi-cantilevers that can increase the surface area examined in real life scenarios.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lewis Mortimer Gomez, Edmy Ferrer, Tatiana Luna, Samuel P. Hernandez, and Miguel E. Castro "A near field optical microscopy study of trinitrotoluene", Proc. SPIE 5794, Detection and Remediation Technologies for Mines and Minelike Targets X, (10 June 2005); https://doi.org/10.1117/12.603945
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Near field scanning optical microscopy

Luminescence

Atmospheric particles

Atomic force microscopy

Aerosols

Particles

Near field

Back to Top