Quantum computing, metrology, and imaging

Hwang Lee; Pavel Lougovski; Jonathan P. Dowling

doi:10.1117/12.607478

23 May 2005 Quantum computing, metrology, and imaging (Invited Paper)

Hwang Lee, Pavel Lougovski, Jonathan P. Dowling

Proceedings Volume 5842, Fluctuations and Noise in Photonics and Quantum Optics III; (2005) https://doi.org/10.1117/12.607478
Event: SPIE Third International Symposium on Fluctuations and Noise, 2005, Austin, Texas, United States

Abstract

Information science is entering into a new era in which certain subtleties of quantum mechanics enables large enhancements in computational efficiency and communication security. Naturally, precise control of quantum systems required for the implementation of quantum information processing protocols implies potential breakthoughs in other sciences and technologies. We discuss recent developments in quantum control in optical systems and their applications in metrology and imaging.

Citation Download Citation

Hwang Lee, Pavel Lougovski, and Jonathan P. Dowling "Quantum computing, metrology, and imaging (Invited Paper)", Proc. SPIE 5842, Fluctuations and Noise in Photonics and Quantum Optics III, (23 May 2005); https://doi.org/10.1117/12.607478

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