Investigation on the stimulated Brillouin scattering threshold with broadband KrF laser

Chao Wang; Zhiwei Lu; Dianyang Lin; Xiaohui Wang; Xiuzhang Tang; Haifen Zhang; Yusheng Shan

doi:10.1117/12.633901

8 June 2005 Investigation on the stimulated Brillouin scattering threshold with broadband KrF laser

Chao Wang, Zhiwei Lu, Dianyang Lin, Xiaohui Wang, Xiuzhang Tang, Haifen Zhang, Yusheng Shan

Proceedings Volume 5851, Fundamental Problems of Optoelectronics and Microelectronics II; (2005) https://doi.org/10.1117/12.633901
Event: Fundamental Problems of Optoelectronics and Microelectronics II, 2004, Khabrovsk, Russian Federation

Abstract

A 1.5m long cell, different focusing lens, a KrF laser which bandwidth is 0.5cm^-1, and SF₆ gas as Brillouin medium are used in the experiment. The influences of focus length and SF₆ pressure on threshold of stimulated Brillouin scattering excited by broadband KrF laser were investigated, respectively. The SBS threshold increases with increasing of the focus length and decreasing of the SF₆ pressure. The results show that the threshold of broadband SBS is various with the different focus length and SF₆ pressure. For more precisely to explain the experimental results, a novel model considering optical breakdown and pump linewidth was presented. The model we proposed here assumes that the KrF laser spectrum is made up of a seriues of narrowband spectra, each generating one Stokes wave. In addition, it is assumed further that the neighbors of one narrowband spectrum also contribute to the generation of its corresponding Stokes wave to some degree. Optical breakdown is assumed to lead to the loss of pumping energy only. The experimental results are consistent with the numerical theory.

Citation Download Citation

Chao Wang, Zhiwei Lu, Dianyang Lin, Xiaohui Wang, Xiuzhang Tang, Haifen Zhang, and Yusheng Shan "Investigation on the stimulated Brillouin scattering threshold with broadband KrF laser", Proc. SPIE 5851, Fundamental Problems of Optoelectronics and Microelectronics II, (8 June 2005); https://doi.org/10.1117/12.633901

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