Automatic inspection of pavement cracking distress

B. Xu; Y. Huang D.D.S.

doi:10.1117/12.613770

16 September 2005 Automatic inspection of pavement cracking distress

B. Xu, Y. Huang D.D.S.

Proceedings Volume 5909, Applications of Digital Image Processing XXVIII; 590901 (2005) https://doi.org/10.1117/12.613770
Event: Optics and Photonics 2005, 2005, San Diego, California, United States

Abstract

This paper presents the image-processing algorithm customized for high-speed, real-time inspection of pavement cracking. In the algorithm, a pavement image is divided into grid cells of 8x8 pixels and each cell is classified as a non-crack or crack cell using the grayscale information of the border pixels. Whether a crack cell can be regarded as a basic element (or seed) depends on its contrast to the neighboring cells. A number of crack seeds can be called a crack cluster if they fall on a linear string. A crack cluster corresponds to a dark strip in the original image that may or may not be a section of a real crack. Additional conditions to verify a crack cluster include the requirements in the contrast, width and length of the strip. If verified crack clusters are oriented in similar directions, they will be joined to become one crack. Because many operations are performed on crack seeds rather than on the original image, crack detection can be executed simultaneously when the frame grabber is forming a new image, permitting real-time, online pavement survey. The trial test results show a good repeatability and accuracy when multiple surveys were conducted at different driving conditions.

Citation Download Citation

B. Xu and Y. Huang D.D.S. "Automatic inspection of pavement cracking distress", Proc. SPIE 5909, Applications of Digital Image Processing XXVIII, 590901 (16 September 2005); https://doi.org/10.1117/12.613770

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