Paper
1 May 1986 The Use Of Semiconductor Imagers In High Energy Particle Physics
Erik H. M. Heijne
Author Affiliations +
Proceedings Volume 0591, Solid-State Imagers and Their Applications; (1986) https://doi.org/10.1117/12.952071
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France
Abstract
Various silicon devices are presently under development to enable the 3-dimensional reconstruction, with a precision of a few µm, of the particle trajectories very close to the interaction point, both for fixed target and collider experiments. The techniques employed are quite similar to those used for X-ray or infrared imaging.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Erik H. M. Heijne "The Use Of Semiconductor Imagers In High Energy Particle Physics", Proc. SPIE 0591, Solid-State Imagers and Their Applications, (1 May 1986); https://doi.org/10.1117/12.952071
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Cited by 6 scholarly publications.
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KEYWORDS
Particles

Sensors

Silicon

Imaging systems

Semiconductors

Charge-coupled devices

Diodes

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