Evaluation of properties of various type CdTe hard x-ray detectors

Asuka Togami; Yu Ishida; Toru Aoki; Yoshinori Hatanaka; Jiro Temmyo

doi:10.1117/12.620071

16 September 2005 Evaluation of properties of various type CdTe hard x-ray detectors

Asuka Togami, Yu Ishida, Toru Aoki, Yoshinori Hatanaka, Jiro Temmyo

Proceedings Volume 5922, Hard X-Ray and Gamma-Ray Detector Physics VII; 592210 (2005) https://doi.org/10.1117/12.620071
Event: Optics and Photonics 2005, 2005, San Diego, California, United States

Abstract

M-π -n detector and Schottky detector which were different barriers were evaluated by measuring spectrum as imaging detectors. These spectrum performances showed that the effect of polarization in these detectors was similarly occurred. The current-time characteristics and capacitance-time characteristics were measured for the detectors and it was found that these characteristics were due to the effect of polarization.

Citation Download Citation

Asuka Togami, Yu Ishida, Toru Aoki, Yoshinori Hatanaka, and Jiro Temmyo "Evaluation of properties of various type CdTe hard x-ray detectors", Proc. SPIE 5922, Hard X-Ray and Gamma-Ray Detector Physics VII, 592210 (16 September 2005); https://doi.org/10.1117/12.620071

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available