Fourier Transform estimation of reflecting thin film thickness

Pierre G. Verly

doi:10.1117/12.626713

4 October 2005 Fourier Transform estimation of reflecting thin film thickness

Pierre G. Verly

Proceedings Volume 5963, Advances in Optical Thin Films II; 596306 (2005) https://doi.org/10.1117/12.626713
Event: Optical Systems Design 2005, 2005, Jena, Germany

Abstract

A parallel was recently established between an empirical procedure for the estimation of reflecting thin film thickness and new results derived from a Fourier Transform (FT) thin film synthesis technique. For simplicity the proposed FT approach was limited to a particular case. The approach is generalized in the present work and practical considerations are discussed. It is shown that good results are possible although the generalized problem is more complex from the FT point of view.

Citation Download Citation

Pierre G. Verly "Fourier Transform estimation of reflecting thin film thickness", Proc. SPIE 5963, Advances in Optical Thin Films II, 596306 (4 October 2005); https://doi.org/10.1117/12.626713

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