CCD Advances For X-Ray Scientific Measurements In 1985

James Janesick; Tom Elliott; Stewart Collins; Taher Daud; Dave Campbell; Arsham Dingizian; Gordon Garmire

doi:10.1117/12.966602

14 July 1986 CCD Advances For X-Ray Scientific Measurements In 1985

James Janesick, Tom Elliott, Stewart Collins, Taher Daud, Dave Campbell, Arsham Dingizian, Gordon Garmire

Proceedings Volume 0597, X-Ray Instrumentation in Astronomy; (1986) https://doi.org/10.1117/12.966602
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France

Abstract

A theoretical model is presented which predicts the output response of a CCD to soft X-ray spectra. The model simulates the four fundamental parameters that ultimately limit CCD performance: Quantum efficiency, charge collection efficiency, charge transfer efficiency, and read noise. Simulated results are presented for a wide variety of CCD structures, and general conclusions are presented about achieving a practical balance of sensitivity, energy, and spatial resolution for an AXAF instrument. We compare the results of the analysis to an existing state-of-the-art CCD and project improvements which will be made in the near future.

Citation Download Citation

James Janesick, Tom Elliott, Stewart Collins, Taher Daud, Dave Campbell, Arsham Dingizian, and Gordon Garmire "CCD Advances For X-Ray Scientific Measurements In 1985", Proc. SPIE 0597, X-Ray Instrumentation in Astronomy, (14 July 1986); https://doi.org/10.1117/12.966602

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