Electromagnetic models for the analysis and design of complex diffractive microstructures

Tuomas Vallius; Jari Turunen

doi:10.1117/12.667699

20 January 2006 Electromagnetic models for the analysis and design of complex diffractive microstructures

Tuomas Vallius, Jari Turunen

Proceedings Volume 6027, ICO20: Optical Information Processing; 602704 (2006) https://doi.org/10.1117/12.667699
Event: ICO20:Optical Devices and Instruments, 2005, Changchun, China

Abstract

A review of electromagnetic models for the analysis of complex microstructures for controlling optical fields is provided. An overview of the most useful rigorous approaches and indications of their computational complexity as well as their domain of applicability is first presented. Then two types of approximate electromagnetic approaches are discusses: local interface techniques and local perturbation methods. These are compared to rigorous methods with a view on computational complexity and domain of applicability.

Citation Download Citation

Tuomas Vallius and Jari Turunen "Electromagnetic models for the analysis and design of complex diffractive microstructures", Proc. SPIE 6027, ICO20: Optical Information Processing, 602704 (20 January 2006); https://doi.org/10.1117/12.667699

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