Paper
9 June 2006 Investigation of photoelectron properties in cubic AgCl emulsion with uniformly doped formate ions
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Proceedings Volume 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 61491W (2006) https://doi.org/10.1117/12.674258
Event: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2005, Xian, China
Abstract
In this experiment the microwave absorption and phase-sensitive detection technique was used to detect the time-resolved signal of photoelectrons generated by 35-ps laser pulses in AgCl emulsions uniformly doped with different concentrations of formate ions (HCO2-). According to photoelectron decay signal, the photoelectron decay properties and the trap-capture properties, influencing the efficiency of latent image formation of the cubic AgCl grains, were discussed. The results indicate that when its concentration is 10-5mol/molAg, the formate ions act as hole traps obviously, enhancing the escape of electrons from pair recombination, but when its concentration is more than or less than 10-5mol/molAg, the formate ions may not act as hole traps effectively. We find that the optimal concentration of uniformly doped formate ions which can increase the photoelectron lifetime effectively is 10-5mol/molAg.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Guang-Sheng Fu, Xian Zhou, Shao-Peng Yang, Xiao-Wei Li, Xiao-Dong Tian, and Li Han "Investigation of photoelectron properties in cubic AgCl emulsion with uniformly doped formate ions", Proc. SPIE 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 61491W (9 June 2006); https://doi.org/10.1117/12.674258
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KEYWORDS
Ions

Microwave radiation

Silver

Electrons

Image acquisition

Signal detection

Absorption

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