Off-axis Z-scan technique for investigation of nonlinear refraction: aperture size effect

Aleksandr I. Ryasnyanskiy

doi:10.1117/12.677965

19 May 2006 Off-axis Z-scan technique for investigation of nonlinear refraction: aperture size effect

Aleksandr I. Ryasnyanskiy

Author Affiliations +

Proceedings Volume 6257, ICONO 2005: Nonlinear Laser Spectroscopy, High Precision Measurements, and Laser Biomedicine and Chemistry; 62570C (2006) https://doi.org/10.1117/12.677965
Event: ICONO 2005, 2005, St. Petersburg, Russian Federation

Abstract

The results of theoretical investigations of the off-axis Z-scan technique for the measurement of nonlinear refraction in materials are presented. The normalized transmittances are calculated for different aperture radii and positions. The dependence of both the normalized transmittance amplitude (T_pv) and the distance between maximum and minimum (Z_pv) on the aperture radius is analyzed.

Citation Download Citation

Aleksandr I. Ryasnyanskiy "Off-axis Z-scan technique for investigation of nonlinear refraction: aperture size effect", Proc. SPIE 6257, ICONO 2005: Nonlinear Laser Spectroscopy, High Precision Measurements, and Laser Biomedicine and Chemistry, 62570C (19 May 2006); https://doi.org/10.1117/12.677965

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE