Paper
13 October 2006 A linear diffraction grating interferometer with high accuracy
Kuang-Chao Fan, Yu-Sheng Liu, Ye-Jin Chen, Fang Cheng
Author Affiliations +
Proceedings Volume 6280, Third International Symposium on Precision Mechanical Measurements; 628008 (2006) https://doi.org/10.1117/12.715260
Event: Third International Symposium on Precision Mechanical Measurements, 2006, Urumqi, China
Abstract
A new miniature nanometer interferometer using grating Doppler effect is developed. The principle of this interferometer can be attributed to the phase information encoded by the ±1st order diffractive light beams. Properly interfering these two light beams leads to modulation similar to Doppler frequency shift, which can be translated to displacement measurement via phase decoding. Because of the measurement standard of grating interferometer system is the grating pitch, compared to the commonly used laser interferometer, the diffractive grating system reduces the environment influences on measurement accuracy. The calibration experiment between grating and HP5529A has been implemented. The measurement results show this grating interferometer measurement system is applicable for higher accuracy in long stroke.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kuang-Chao Fan, Yu-Sheng Liu, Ye-Jin Chen, and Fang Cheng "A linear diffraction grating interferometer with high accuracy", Proc. SPIE 6280, Third International Symposium on Precision Mechanical Measurements, 628008 (13 October 2006); https://doi.org/10.1117/12.715260
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Cited by 11 scholarly publications.
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KEYWORDS
Diffraction gratings

Interferometers

Diffraction

Signal processing

Doppler effect

Beam splitters

Wave plates

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