GOES N-P SXI in-flight calibration using the Crab Nebula

Karl K. Klett Jr.; Steven Hill

doi:10.1117/12.680800

29 August 2006 GOES N-P SXI in-flight calibration using the Crab Nebula

Karl K. Klett Jr., Steven Hill

Proceedings Volume 6317, Advances in X-Ray/EUV Optics, Components, and Applications; 631702 (2006) https://doi.org/10.1117/12.680800
Event: SPIE Optics + Photonics, 2006, San Diego, California, United States

Abstract

A potential calibration strategy for the N-P series Solar X-ray Imager (SXI), on the Geostationary Operational Environmental Satellite (GOES), that uses an astronomical X-ray source (the Crab Nebula) is analyzed below. The Crab Nebula is one of the brightest X-ray sources in the sky, and is located near the ecliptic, making consideration of such a calibration possible due to its annual proximity to the sun. The results of these analyses show that in-flight calibration of SXI N-P using the Crab Nebula is possible. Using the longest single exposure which the instrument is capable of making (65 sec) yields a signal-to noise-ratio somewhat insufficient to meet SXI N-P's 20% photometric accuracy requirement. However, summing several 65 second images would increase the signal to noise ratio, making such a calibration readily possible. This analysis demonstrates that effective calibration of SXI N-P could be carried out with only the relatively small cost of operations and analysis to the government, using approximately 12 hours of observing time per year. Expensive calibration underflights, using sounding rockets, would not be needed for SXI N-P. It is important to note that if the GOES R SXI, the follow on series to GOES N-P, uses a normal incidence primary mirror design, an astrophysical calibration with the Crab nebula will not be possible because of the change in instrument spectral response. However, other astrophysical sources could be examined.

Citation Download Citation

Karl K. Klett Jr. and Steven Hill "GOES N-P SXI in-flight calibration using the Crab Nebula", Proc. SPIE 6317, Advances in X-Ray/EUV Optics, Components, and Applications, 631702 (29 August 2006); https://doi.org/10.1117/12.680800

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