Paper
15 September 2006 NIMO: a new tool for asphere and free-form optics measurement
Luc Joannes, Marie Heraud, Renaud Ligot, Bruno Saoul, Olivier Dupont
Author Affiliations +
Proceedings Volume 6341, Speckle06: Speckles, From Grains to Flowers; 634134 (2006) https://doi.org/10.1117/12.696006
Event: Speckle06: Speckles, From Grains to Flowers, 2006, Nimes, France
Abstract
NIMO is a new measurement tool based on the Phase-Shifting Schlieren technique [1]. The technique combines the Schlieren principle with the phase-shifting technique generally used in interferometry. By an adequate Schlieren filter and an adapted set-up, some Schlieren Fringes coding light beam deviation angles are generated. After the application of the phase shift technique, the Schlieren phase is calculated and converted in beam deviation values. The technique has been validated on conventional optical element ranging from millimetre to decimetre scales. NIMO opens a new step in metrology in a wide industrial range in both reflection and transmission (e.g. optical manufacturing, glass industry, ophthalmic industry,...). In [2],we focused on fluid physics applications and the implementation of the technique in a microscope for MEMS measurements. In [3], we described an adapted setup in which all the phase shifted images are acquired simultaneously opening the possibility to measure dynamic phenomena with NIMO. This paper is focused on the instrument recently developed for ophthalmic industry. The performances of the instrument are given and industrial applications in free-form and aspherical surfaces metrology are demonstrated.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Luc Joannes, Marie Heraud, Renaud Ligot, Bruno Saoul, and Olivier Dupont "NIMO: a new tool for asphere and free-form optics measurement", Proc. SPIE 6341, Speckle06: Speckles, From Grains to Flowers, 634134 (15 September 2006); https://doi.org/10.1117/12.696006
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KEYWORDS
Phase shifts

Aspheric lenses

Optical filters

Optical testing

Visualization

Interferometry

Metrology

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