Determination of the dielectric constant of coatings with a capacitance probe

A. Guadarrama-Santana; A. García-Valenzuela

doi:10.1117/12.742372

16 May 2007 Determination of the dielectric constant of coatings with a capacitance probe

A. Guadarrama-Santana, A. García-Valenzuela

Proceedings Volume 6422, Sixth Symposium Optics in Industry; 64221N (2007) https://doi.org/10.1117/12.742372
Event: Sixth Symposium Optics in Industry, 2007, Monterrey, Mexico

Abstract

This work shows that in many practical situations it is possible to obtain the dielectric constant of coatings on plain conductive substrates by means of a single electrode-sample capacitance measurement without precise knowledge of its thickness. 3D simulations of spherical electrode-dielectric coating-conductive plain substrate capacitive system are performed in order to determine theoretically the suitable electrode dimension for a coating thickness range of interest.

Citation Download Citation

A. Guadarrama-Santana and A. García-Valenzuela "Determination of the dielectric constant of coatings with a capacitance probe", Proc. SPIE 6422, Sixth Symposium Optics in Industry, 64221N (16 May 2007); https://doi.org/10.1117/12.742372

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