Computer Aided Measurement Techniques for Integrated Optic Devices

H. F. Schlaak; G. Sulz; Yuan-ling Zhan; A. Brandenburg

doi:10.1117/12.938157

3 November 1986 Computer Aided Measurement Techniques for Integrated Optic Devices

H. F. Schlaak, G. Sulz, Yuan-ling Zhan, A. Brandenburg

Proceedings Volume 0651, Integrated Optical Circuit Engineering III; (1986) https://doi.org/10.1117/12.938157
Event: 1986 International Symposium/Innsbruck, 1986, Innsbruck, Austria

Abstract

Computer aided measurement systems for the determination of nearfield intensity profiles, insertion loss, waveguide attenuation by Fabry-Perot resonance and refractive index profiles by effective indices have been developed. The repeatability and accuracy of the measurements have been analyzed.

Citation Download Citation

H. F. Schlaak, G. Sulz, Yuan-ling Zhan, and A. Brandenburg "Computer Aided Measurement Techniques for Integrated Optic Devices", Proc. SPIE 0651, Integrated Optical Circuit Engineering III, (3 November 1986); https://doi.org/10.1117/12.938157

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