Paper
13 October 1986 Effects Of Dispersion On The Determination Of Optical Constants Of Thin Films
C K. Carniglia
Author Affiliations +
Proceedings Volume 0652, Thin Film Technologies II; (1986) https://doi.org/10.1117/12.938373
Event: 1986 International Symposium/Innsbruck, 1986, Innsbruck, Austria
Abstract
The optical constants n and k for a weakly absorbing thin film material can be determined from the transmission scan of a single thick layer of the material coated on a substrate. The envelope method makes use of the wavelengths and transmittance values of the maxima and minima of a spectral scan to determine the optical constants. The values and positions of these extrema are affected by the dispersion of the optical constants. The dispersion of the index affects the position of the odd quarterwave extrema, but not the halfwave extrema. The effect is small (typically 0.5%) for high index oxide materials. The dispersion in the extinction coefficient causes larger errors, especially near the absorption edge where the extrema can be shifted by several percent. The effects of the dispersion are calculated and the results are used to obtain more accurate values of the optical constants and thickness of the film. The various errors and the resulting corrections to the optical constants are compared for a typical high index oxide film.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C K. Carniglia "Effects Of Dispersion On The Determination Of Optical Constants Of Thin Films", Proc. SPIE 0652, Thin Film Technologies II, (13 October 1986); https://doi.org/10.1117/12.938373
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KEYWORDS
Transmittance

Thin films

Absorption

Americium

Oxides

Zirconium dioxide

Dielectrics

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