The Present Status Of Electronic Speckle Pattern Interferometry (E.S.P.I.) With Respect To Automatic Inspection And Measurement

B D Bergquist; P C Montgomery; F Mendoza-Santoyo; P Henry; J Tyrer

doi:10.1117/12.938274

17 November 1986 The Present Status Of Electronic Speckle Pattern Interferometry (E.S.P.I.) With Respect To Automatic Inspection And Measurement

B D Bergquist, P C Montgomery, F Mendoza-Santoyo, P Henry, J Tyrer

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Proceedings Volume 0654, Automatic Optical Inspection; (1986) https://doi.org/10.1117/12.938274
Event: 1986 International Symposium/Innsbruck, 1986, Innsbruck, Austria

Abstract

Recent developments in digital processing have renewed interest in E.S.P.I., whereby direct contouring is possible with fringes of interferometric quality. It is now possible to locate points on the object accurately in association with E.S.P.I. analysis, although a trade-off between point resolution and fringe visibility seems likely. Nevertheless the time is close for the development of a complete optical inspection system.

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B D Bergquist, P C Montgomery, F Mendoza-Santoyo, P Henry, and J Tyrer "The Present Status Of Electronic Speckle Pattern Interferometry (E.S.P.I.) With Respect To Automatic Inspection And Measurement", Proc. SPIE 0654, Automatic Optical Inspection, (17 November 1986); https://doi.org/10.1117/12.938274

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KEYWORDS

Inspection

Cameras

Speckle

Interferometry

Holography

Optical inspection

Image resolution

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