Performance limits of simulation models for noise characterization of mm-wave devices

Ali Abou-Elnour

doi:10.1117/12.725093

11 June 2007 Performance limits of simulation models for noise characterization of mm-wave devices

Ali Abou-Elnour

Proceedings Volume 6600, Noise and Fluctuations in Circuits, Devices, and Materials; 66001R (2007) https://doi.org/10.1117/12.725093
Event: SPIE Fourth International Symposium on Fluctuations and Noise, 2007, Florence, Italy

Abstract

Based on Boltzmann transport equation, the drift-diffusion, hydrodynamic, and Monte-Carlo physical models are accurately developed. The model equations are self-consistently solved with Poisson equation, and with Schrödinger equation when quantization effects take place, in one and two-dimensions to characterize the operation and optimize the structure of mm-wave devices. The effects of the devices dimensions, biasing conditions and operating frequencies on the accuracy of the obtained model (simulator) results are thoroughly investigated. Based on physical understanding of the models, the simulation results are analyzed and conclusions are drawn to fully determine the limits at which a certain device simulator can be accurately and efficiently used to characterize the noise behaviour of mm-wave devices.

Citation Download Citation

Ali Abou-Elnour "Performance limits of simulation models for noise characterization of mm-wave devices", Proc. SPIE 6600, Noise and Fluctuations in Circuits, Devices, and Materials, 66001R (11 June 2007); https://doi.org/10.1117/12.725093

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