Paper
26 February 2008 Constraint optimization method for line fitting
Author Affiliations +
Proceedings Volume 6813, Image Processing: Machine Vision Applications; 68130I (2008) https://doi.org/10.1117/12.769002
Event: Electronic Imaging, 2008, San Jose, California, United States
Abstract
Line fitting and moments are two different problems and most articles discuss these two problems separately. In this paper, using the constraint optimization, we relate the line fitting to moments. We show that the eigen vectors of the second order central moments are fitted line directional vectors, and the eigen value is the fitting error. Then, we further show that the line fitting errors can be computed directly from the first and second moment invariants. From the relation between line fitting and moments, we propose a mask-size independent approach to implement the line fitting for curves or object contours. The computational cost of the new approach is independent of the mask size. It is computationally efficient if compared to the conventional approach whose computational cost is proportional to the fitting mask size.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bing C. Li "Constraint optimization method for line fitting", Proc. SPIE 6813, Image Processing: Machine Vision Applications, 68130I (26 February 2008); https://doi.org/10.1117/12.769002
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Pattern recognition

Lithium

Direct methods

Image processing

Detection and tracking algorithms

Electronic imaging

Error analysis

Back to Top