Characterization Of Multilayer Structures For Soft X-Ray Laser Research

M. Kuhne; K. Danzmann; P. Muller; B. Wende; N. M. Ceglio; D. G. Stearns; A. M. Hawryluk

doi:10.1117/12.964825

9 April 1987 Characterization Of Multilayer Structures For Soft X-Ray Laser Research

M. Kuhne, K. Danzmann, P. Muller, B. Wende, N. M. Ceglio, D. G. Stearns, A. M. Hawryluk

Proceedings Volume 0688, Multilayer Structures & Laboratory X-Ray Laser Research; (1987) https://doi.org/10.1117/12.964825
Event: 30th Annual Technical Symposium, 1986, San Diego, United States

Abstract

A reflectometer has been set up at the radiometric laboratory of PTB at the Berlin electron storage ring BESSY. Special attention has been paid to optimize the instrumentation for the characterization of multilayer structures suitable for laboratory soft x-ray laser research. The instrumentation is described and its performance demonstrated showing examples of optical component characterization.

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M. Kuhne, K. Danzmann, P. Muller, B. Wende, N. M. Ceglio, D. G. Stearns, and A. M. Hawryluk "Characterization Of Multilayer Structures For Soft X-Ray Laser Research", Proc. SPIE 0688, Multilayer Structures & Laboratory X-Ray Laser Research, (9 April 1987); https://doi.org/10.1117/12.964825

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