Multilayer piezoelectric stack actuator characterization

Stewart Sherrit; Christopher M. Jones; Jack B. Aldrich; Chad Blodget; Xioaqi Bao; Mircea Badescu; Yoseph Bar-Cohen

doi:10.1117/12.776396

2 April 2008 Multilayer piezoelectric stack actuator characterization

Stewart Sherrit, Christopher M. Jones, Jack B. Aldrich, Chad Blodget, Xioaqi Bao, Mircea Badescu, Yoseph Bar-Cohen

Proceedings Volume 6929, Behavior and Mechanics of Multifunctional and Composite Materials 2008; 692909 (2008) https://doi.org/10.1117/12.776396
Event: SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring, 2008, San Diego, California, United States

Abstract

Future NASA missions are increasingly seeking to use actuators for precision positioning to accuracies of the order of fractions of a nanometer. For this purpose, multilayer piezoelectric stacks are being considered as actuators for driving these precision mechanisms. In this study, sets of commercial PZT stacks were tested in various AC and DC conditions at both nominal and extreme temperatures and voltages. AC signal testing included impedance, capacitance and dielectric loss factor of each actuator as a function of the small-signal driving sinusoidal frequency, and the ambient temperature. DC signal testing includes leakage current and displacement as a function of the applied DC voltage. The applied DC voltage was increased to over eight times the manufacturers' specifications to investigate the correlation between leakage current and breakdown voltage. Resonance characterization as a function of temperature was done over a temperature range of -180°C to +200°C which generally exceeded the manufacturers' specifications. In order to study the lifetime performance of these stacks, five actuators from one manufacturer were driven by a 60volt, 2 kHz sine-wave for ten billion cycles. The tests were performed using a Lab-View controlled automated data acquisition system that monitored the waveform of the stack electrical current and voltage. The measurements included the displacement, impedance, capacitance and leakage current and the analysis of the experimental results will be presented.

Citation Download Citation

Stewart Sherrit, Christopher M. Jones, Jack B. Aldrich, Chad Blodget, Xioaqi Bao, Mircea Badescu, and Yoseph Bar-Cohen "Multilayer piezoelectric stack actuator characterization", Proc. SPIE 6929, Behavior and Mechanics of Multifunctional and Composite Materials 2008, 692909 (2 April 2008); https://doi.org/10.1117/12.776396

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available