Active thermography for potato characterization

Sheng-Jen Hsieh; Chih-Chen Sun

doi:10.1117/12.778137

17 March 2008 Active thermography for potato characterization

Sheng-Jen Hsieh, Chih-Chen Sun

Proceedings Volume 6939, Thermosense XXX; 69390P (2008) https://doi.org/10.1117/12.778137
Event: SPIE Defense and Security Symposium, 2008, Orlando, Florida, United States

Abstract

This paper describes the design of a semi-automated heating and scanning system and analytic method for potato characterization. Potatoes are heated using lamps in a heating chamber and then transferred on a movable fixture to an imaging chamber. A non-linear model was designed to predict which potatoes have excessive sugar defects and the model was evaluated with good results. Results from this research will benefit potato growers and manufacturers/producers of potato-based products such as chips and fries.

Citation Download Citation

Sheng-Jen Hsieh and Chih-Chen Sun "Active thermography for potato characterization", Proc. SPIE 6939, Thermosense XXX, 69390P (17 March 2008); https://doi.org/10.1117/12.778137

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