X-ray, gamma-ray detector/imager by CdTe semiconductor and its applications

Toru Aoki; Hisashi Morii; Takuya Nakashima; Yasuyuki Takahashi; Gosuke Ohashi; Yasuhiro Tomita; Yoichiro Neo; Hidenori Mimura

doi:10.1117/12.796991

22 April 2008 X-ray, gamma-ray detector/imager by CdTe semiconductor and its applications

Toru Aoki, Hisashi Morii, Takuya Nakashima, Yasuyuki Takahashi, Gosuke Ohashi, Yasuhiro Tomita, Yoichiro Neo, Hidenori Mimura

Author Affiliations +

Proceedings Volume 7008, Eighth International Conference on Correlation Optics; 70080R (2008) https://doi.org/10.1117/12.796991
Event: Eighth International Conference on Correlation Optics, 2007, Chernivsti, Ukraine

Abstract

Photon counting type X-ray, gamma-ray detector and imager were developed by using CdTe compound semiconductor. The detector / imager could be applied for practical application and we tried to apply material identificated X-ray CT. The imager has photon energy discriminate function and high linearity between number of incident photons and output counts. It make high contrast image for X-ray penetration image and material identification in X-ray computed tomography (CT) measurement.

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Toru Aoki, Hisashi Morii, Takuya Nakashima, Yasuyuki Takahashi, Gosuke Ohashi, Yasuhiro Tomita, Yoichiro Neo, and Hidenori Mimura "X-ray, gamma-ray detector/imager by CdTe semiconductor and its applications", Proc. SPIE 7008, Eighth International Conference on Correlation Optics, 70080R (22 April 2008); https://doi.org/10.1117/12.796991

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