Design and development of the SIMBOL-X hard x-ray optics

G. Pareschi; P. Attinà; S. Basso; G. Borghi; W. Burkert; R. Buzzi; O. Citterio; M. Civitani; P. Conconi; V. Cotroneo; G. Cusumano; E. Dell'Orto; M. Freyberg; G. D. Hartner; P. Gorenstein; E. Mattaini; F. Mazzoleni; G. Parodi; S. Romaine; D. Spiga; G. Tagliaferri; R. Valtolina; G. Valsecchi; D. Vernani

doi:10.1117/12.790336

15 July 2008 Design and development of the SIMBOL-X hard x-ray optics

G. Pareschi, P. Attinà, S. Basso, G. Borghi, W. Burkert, R. Buzzi, O. Citterio, M. Civitani, P. Conconi, V. Cotroneo, G. Cusumano, E. Dell'Orto, M. Freyberg, G. D. Hartner, P. Gorenstein, E. Mattaini, F. Mazzoleni, G. Parodi, S. Romaine, D. Spiga, G. Tagliaferri, R. Valtolina, G. Valsecchi, D. Vernani

Author Affiliations +

Proceedings Volume 7011, Space Telescopes and Instrumentation 2008: Ultraviolet to Gamma Ray; 70110N (2008) https://doi.org/10.1117/12.790336
Event: SPIE Astronomical Telescopes + Instrumentation, 2008, Marseille, France

Abstract

The SIMBOL-X formation-flight X-ray mission will be operated by ASI and CNES in 2014, with a large participation of the French and Italian high energy astrophysics scientific community. Also German and US Institutions are contributing in the implementation of the scientific payload. Thanks to the formation-flight architecture, it will be possible to operate a long (20 m) focal length grazing incidence mirror module, formed by 100 confocal multilayer-coated Wolter I shells. This system will allow us to focus X-rays over a very broad energy band, from 0.5 keV up to 80 keV and beyond, with more than two orders of magnitude improvement in angular resolution (20 arcsec HEW) and sensitivity (0.5 µCrab on axis @30 keV) compared to non focusing detectors used so far. The X-ray mirrors will be realized by Ni electroforming replication, already successfully used for BeppoSAX, XMM-Newton, and JET-X/SWIFT; the thickness trend will be about two times less than for XMM, in order to save mass. Multilayer reflecting coatings will be implemented, in order to improve the reflectivity beyond 10 keV and to increase the field of view 812 arcmin at 30 keV). In this paper, the SIMBOL-X optics design, technology and implementation challenges will be discussed; it will be also reported on recent results obtained in the context of the SIMBOL-X optics development activities.

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G. Pareschi, P. Attinà, S. Basso, G. Borghi, W. Burkert, R. Buzzi, O. Citterio, M. Civitani, P. Conconi, V. Cotroneo, G. Cusumano, E. Dell'Orto, M. Freyberg, G. D. Hartner, P. Gorenstein, E. Mattaini, F. Mazzoleni, G. Parodi, S. Romaine, D. Spiga, G. Tagliaferri, R. Valtolina, G. Valsecchi, and D. Vernani "Design and development of the SIMBOL-X hard x-ray optics", Proc. SPIE 7011, Space Telescopes and Instrumentation 2008: Ultraviolet to Gamma Ray, 70110N (15 July 2008); https://doi.org/10.1117/12.790336

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