Polarimetry with a soft x-ray spectrometer

Herman L. Marshall

doi:10.1117/12.787249

15 July 2008 Polarimetry with a soft x-ray spectrometer

Herman L. Marshall

Proceedings Volume 7011, Space Telescopes and Instrumentation 2008: Ultraviolet to Gamma Ray; 701129 (2008) https://doi.org/10.1117/12.787249
Event: SPIE Astronomical Telescopes + Instrumentation, 2008, Marseille, France

Abstract

An approach for measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics is described. A set of multilayer-coated flats reflect the dispersed X-rays to the instrument detectors. The intensity variation as a function of energy and position angle is measured to determine three Stokes parameters: I, Q, and U. By laterally grading the multilayer optics and matching the dispersion of the gratings, one may take advantage of high multilayer reflectivities and achieve modulation factors over 80% over the entire 0.2 to 0.8 keV band. A sample design is shown that could be used with a small orbiting mission.

Citation Download Citation

Herman L. Marshall "Polarimetry with a soft x-ray spectrometer", Proc. SPIE 7011, Space Telescopes and Instrumentation 2008: Ultraviolet to Gamma Ray, 701129 (15 July 2008); https://doi.org/10.1117/12.787249

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