Paper
15 July 2008 Designing an x-ray baffle for stray-light reduction at the focal plane of the Wide Field Imager on board EDGE
Author Affiliations +
Abstract
We exploited a ray-tracing Montecarlo code to investigate the effects of stray-light on the performances of the Wide Field Imager (FoV = 1.5 deg) on board the EDGE satellite. We found non negligible stray-light contamination up to ~ 8 deg off-axis angles. We discuss the benefits of a baffle in order to reduce this contamination, that would strongly affect the telescope sensitivity, and present two possible baffle designs based on results of simulations.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
E. Perinati, T. Mineo, G. Cusumano, L. Piro, G. Pareschi, and M. Barbera "Designing an x-ray baffle for stray-light reduction at the focal plane of the Wide Field Imager on board EDGE", Proc. SPIE 7011, Space Telescopes and Instrumentation 2008: Ultraviolet to Gamma Ray, 701139 (15 July 2008); https://doi.org/10.1117/12.787909
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Cited by 1 scholarly publication.
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KEYWORDS
Telescopes

Photons

Contamination

X-rays

Device simulation

Imaging systems

Sensors

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